计算机学院学术论坛报告

 

Academic Forum on Computer Science and Technology

 

特邀报告 第25期（总第92期）

 

主题报告：   Test & Testability of Electronic Designs

 

报 告 人：   Dr. Chouki Aktouf  (CEO of DeFacTo Technologies)

报告时间：   6月 22日（周一）15:30～16:45

报告地点：   上海大学延长校区行健楼707室

Abstract：The seminar presents the basics of testing electronic chips and systems: definitions and terminology. Also well known Design-For -Testable techniques, methodologies and applications are covered. Finally, a special focus is given to DFT techniques and tools at Register Transfer Level.

 

Dr. Chouki Aktouf  is CEO & Founder of DeFacTo Technologies. Prior to founding DeFacTo in 2004, he was an Associate Professor of Computer Science at the University of Grenoble in France and Leader of the Dependability Research Group within the Institute National Poly-technique de Grenoble. Aktouf has been contributing since more than 20 years in Design for Test and Dependability Computing research activities. He holds a PhD in Electrical Engineering from INPG in 1995.

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Biography：