计算机学院学术论坛报告

 

Academic Forum on Computer Science and Technology

 

特邀报告第23期（总第077期）

 

主题报告：  深亚微米大规模集成电路测试的挑战和机遇

           Challenges and Chances in Deep-Submicron LSI Testing

 

报 告 人：（1）Prof. Seiji Kajihara  （梶原诚司 教授）

          （2）Prof. Xiaoqing Wen （温 晓 青 教授）

报告时间：   3月 20日（周五）15:00～16:30

报告地点：   上海大学延长校区行健楼707室

摘    要：（1）  Introduction to Kyushu Institute of Technology

                           By   Prof. Seiji Kajihara

        （2） Challenges and Chances in Deep-Submicron LSI Testing

                              By   Prof. Xiaoqing Wen

Prof. Seiji Kajihara, Chair of Steering Committee, Asian Test Symposium.

 

Dr. Wen received the B.E. degree from Tsinghua University, Beijing China, in 1986, the M.E. degree from Hiroshima University, Hiroshima, Japan, in 1990, and the Ph.D degree from Osaka University, Osaka, Japan, in 1993. From 1993 to 1997, he was a Lecturer at Akita University, Akita, Japan. He was a Visiting Researcher at University of Wisconsin, Madison, U.S.A., from October 1995 to March 1996. He joined SynTest Technologies, Inc., Sunnyvale, U.S.A., in 1998, and served as its Chief Technology Officer from 2001 to 2003. He joined Kyushu Institute of Technology, Iizuka, Japan, as an Associate Professor in 2004, where is currently a Professor. His research interests include VLSI test, diagnosis, and testable design. He is a senior member of IEEE.

 

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