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学术报告 - 大规模集成电路测试与设计的挑战

发布日期:  2011/04/19  刘华   浏览次数: 部门: 未知   返回

 

计算机学院学术论坛报告

Academic Forum on Computer Science and Technology

特邀报告 第057期(总第167期)

主题报告:大规模集成电路测试与设计的挑战
报 告 人:Prof. Zebo Peng  ( Linköping University, Sweden)
报告时间:2011年4月 26日(周二)13:30~14:45
报告地点:
上海大学延长校区行键楼707
邀 请 人:徐拾义教授

论坛主题:More and more embedded systems are used nowadays for safety-critical applications with stringent reliability and real-time requirements. We are therefore facing the challenge of how to build reliable embedded systems with unreliable components using different fault tolerance techniques.
This seminar will discuss the design of embedded systems for safety-critical applications by considering both fault-tolerance and real-time requirements at the same time. It will describe several key challenges and some solutions to the design and optimization of such systems. 

Biography:Prof. Peng received his B.Sc. degree in Computer Engineering from South China University of Technology in 1982, and his Ph.D. degrees in Computer Science from Linköping University in 1987. He has been Professor of Computer Systems and Director of the Embedded Systems Laboratory at Linköping University since 1996. He was Director of the Swedish National Graduate School in Computer Science in 2006-2008.
Prof. Peng"s research interests include design and test of embedded systems, electronic design automation, SoC testing, fault tolerant design, and real-time systems. He has published over 300 technical papers and four books. He received four best paper awards and a best presentation award at major international conferences. Two of his publications have been selected as the most influential papers of 10 years of DATE (the Design, Automation, and Test in Europe Conference).


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